I have data that i want to test classifiers on. This data has a lot of attributes and the target class that is binary true/false. Additionally i know that data comes from 32 sources called 1-32. This information is in the arff file present.
So i have an arff file:
@attribute <MANY ATTRIBUTES>
@attribute <MANY ATTRIBUTES>
@attribute class {True,False}
@attribute source {1,2,3,4,5,6,7,8,9,...,30,31,32}
In the weka explorer under classifier i can choose cross-validation 4 fold for example. But then weka will order that instances randomly into 4 bins. what i want is that weka will use 24 sources as train and 8 as test. So each source is completely either in test or train but not in both.
Is that somehow possible with the on board methods?